Showing results: 181 - 195 of 366 items found.
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40-735-912 -
Pickering Interfaces Ltd.
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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40-735-902 -
Pickering Interfaces Ltd.
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Cortek Test Solutions
Our test fixture kits provide cost effective solutions to printed circuit board testing and other devices under test. Our modular kits are available in multiple sizes and configurations. They can easily be customized if our standard doesn’t meet your requirements. Removable side panels for ease of fabrication for I/O connections, switches or other hardware.
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Keysight Technologies
The 34980A matrix modules are full cross-point matrices allowing you to connect any row to any column in the same instance. This is a convenient way to connect multiple test instrument points to multiple points on a device under test. All matrix modules also include a relay switch counter to help predict when relays need to be replaced.
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Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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MS012 COM -
MSG Equipment
The device simulates installation of voltage regulator on faultless alternator in order to test its operating performance under different loads and modes, under various rotor resistance parameters. The handset tester conducts diagnostics of all existing types and models of voltage regulators.New types and models of voltage regulators can easily be added by updating software through USB-port. The equipmentis controlledby three encoders and a sensor on colored display. Diagnostics lasts about 2 minutes.
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ESDEMC Technology LLC
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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40-658A-002 -
Pickering Interfaces Ltd.
The 40-658-002 is a PXI multiplexer combining a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in a convenient single slot PXI module. It is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test.
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PGY-UHS II SD/SDIO -
Prodigy Technovations Pvt. Ltd.
UHS II Protocol Analyzer (PGY-UHS II SD/SDIO) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. PGY-UHS II SD/SDIO UHS II Protocol Analyzer is the most feature rich comprehensive Protocol Analyzer available to capture and debug UHS-II protocol data. PGY-UHS-II Protocol Analyzer supports FD156 and HD312 data rate. The innovative active probe has minimum electrical loading on device under test (DUT) and captures protocol data without affecting the performance of DUT.
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High Voltage Switching Test System -
Accel-RF Corporation
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Test Research, Inc.
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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PGY-RFFE-EX-PD -
Prodigy Technovations Pvt. Ltd.
RFFE Protocol Analyzer (PGY-RFFE-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. The RF Front-end control interface (RFFE) Serial bus interface is emerging as a chosen for controlling RF frond end devices. There are variety of front end devices such as Power Amplifiers (PA), Low-Nose Amplifiers (LNA), filters, switches, power management modules, antenna tuners. It is widely used in mobile devices.
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NF Corp.
A frequency response analyzer measures the gain and phase response characteristics with respect to frequency of the device or system under test, by applying a frequency swept sine wave to it and examining its response signal.Featured wide dynamic range realizes high precise measurement, and also ultra low frequency measurement.
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B-1026 -
ROSS ENGINEERING CORPORATION
Ross Engineering Corporation has developed and manufactures a line of Electrostatic Discharge (ESD) testers. One model is designed for explosive proof testing per MIL-I-23659C, Paragraph 4.4.3.2 static discharge test. It incorporates high voltage electro magnetic or air pressure operated relays to safety ground, charge, and dump capacitors into the appropriate device under test. This ESD tester is a portable system utilizing 120V AC power. It is a high reliability device capable of many thousands of cycles.
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781742-01 -
NI
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
